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2019 atomicspectrometry update –a review of advancesin X-ray fluorescencespectrometry and itsspecial applications Christine VanhoofJeffrey R. BaconAndrew T. Ellis2019 год

2019 atomic spectrometry update – a review of advances in X-ray fluorescence spectrometry and its special applications

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Аннотация: This 2019 review covers developments in and applications of XRF techniques such as EDXRF, WDXRF, TXRF, XRF microscopy using technologies such as synchrotron sources, X-ray optics, X-ray tubes and detectors in laboratory, mobile and hand-held systems.
Год издания: 2019
Авторы: Christine Vanhoof, Jeffrey R. Bacon, Andrew T. Ellis, Ursula E. A. Fittschen, László Vincze
Издательство: Royal Society of Chemistry
Источник: Journal of Analytical Atomic Spectrometry
Ключевые слова: X-ray Spectroscopy and Fluorescence Analysis, X-ray Diffraction in Crystallography, Advanced X-ray and CT Imaging