Библиографическое описание:Program for the X-Ray Phase Analysis of Synchrotron Data : научное издание / P. S. Dubinin [et al.]. - Текст : непосредственный // Journal of Surface Investigation: X-Ray, Synchrotron and Neutron Techniques. - 2024. - Т. 18, № 6. - P. 1466-1476. - This work was supported by the Ministry of Science and Higher Education of the Russian Federation (project no. 075-15-2021-1348). - ISSN 1027-4510. - ISSN 1819-7094, DOI 10.1134/S1027451024701416.
Аннотация:A system of automated software and methodological support SPAAR XRD is developed to process sets of diffraction patterns obtained from synchrotron-radiation sources, enabling analysis of the phase composition and structural parameters of materials. This system incorporates a range of methods and software tools for both the 3D and 2D visualization of diffraction patterns, selection of informative patterns, cluster X‑ray phase identification, and multireflection quantitative X-ray phase analysis using the reference-intensity-ratio method. It also calculates the sizes of coherent-scattering regions employing the simplified Scherrer method. The paper presents results from using this system to analyze a series of diffraction patterns collected during two in situ experiments conducted with a vacuum electron–ion–plasma installation developed at the Tomsk Center of Competence in Beam-Plasma Engineering and Synchrotron Research, Institute of High Current Electronics, Siberian Branch, Russian Academy of Sciences. The study examines the high-temperature phase transition between the compounds YbaCo<sub>4</sub>O<sub>8.4</sub> and YbaCo<sub>4</sub>O<sub>7</sub> over the temperature range of 300–460°C. It also investigates the phase-formation process in multilayer Y–Al–O coatings, which are formed through the alternate deposition of Y and Al on a WC8 alloy substrate in an argon–oxygen environment at 350°C.
Источник:Journal of Surface Investigation: X-Ray, Synchrotron and Neutron Techniques
Выпуск:Т. 18, № 6
Номера страниц:1466-1476
Держатель оригинала документа:Institute of High Current Electronics, Siberian Branch, Russian Academy of Sciences, National Research Tomsk Polytechnic University, Siberian Federal University
Количество экземпляров:
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