Библиографическое описание:Magneto-Optical Ellipsometry of Thin Films with Optical Uniaxial Anisotropy : научное издание / O. A. Maximova [et al.]. - Текст : непосредственный // Physics of Metals and Metallography. - 2023. - Т. 124, № 14. - P. 1654-1661. - The research was performed at the Magnetic MAX Materials Laboratory of the Kirensky Institute of Physics SB RAS (created under Megagrant project (agreement no. 075-15-2019-1886) with the financial support of the Russian Science Foundation no. 21-12-00226, <a href="http://rscf.ru/project/21-12-00226/">http://rscf.ru/project/21-12-00226/</a>. - ISSN 0031-918X. - ISSN 1555-6190, DOI 10.1134/s0031918x23601385.
Аннотация:In this paper, we solve the inverse problem of magneto-optical ellipsometry for thin ferromagnetic films with optical uniaxial anisotropy. We work within the framework of the approach we developed earlier analyzing magnetoellipsometric data without using fourth-order M-matrices. We work with ellipsometric relations, in which we take into account the magneto-optical contribution as perturbations, and ellipsometric measurements are carried out on a setup with a simple dipole scheme based on the transverse magneto-optical Kerr effect. We add the magneto-optical response to the expressions known in the literature for the reflection coefficients of anisotropic thin films, which are related to the parameters measured by magneto-optical ellipsometry. As a result, by analyzing the obtained expressions for the reflection coefficients, we obtain information on the total permittivity tensor of a thin film.
Держатель оригинала документа:Kirensky Institute of Physics, Federal Research Center KSC SB RAS, Krasnoyarsk Scientific Center, Federal Research Center KSC SB RAS
Количество экземпляров:
Твёрдая копия издания отсутствует в фонде библиотеки
