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Application of theK-Standards Algorithmfor the ClusteringProblem of ProductionBatches ofSemiconductor Devices Orlov V.I.Rozhnov I.P.Kazakovtsev L.A.2021 год

Application of the K-Standards Algorithm for the Clustering Problem of Production Batches of Semiconductor Devices : доклад, тезисы доклада
доклад, тезисы доклада, статья из сборника материалов конференций

Дополнительные ссылки: eLibrary · Источник статьи
База данных: Каталог библиотеки СФУ
Библиографическое описание: Application of the K-Standards Algorithm for the Clustering Problem of Production Batches of Semiconductor Devices : доклад, тезисы доклада / V. I. Orlov [et al.]. - [S. l. : s. n.], 2021. - Текст : непосредственный // Proceedings of the 2021 15th International Scientific-Technical Conference on Actual Problems of Electronic Instrument Engineering, APEIE 2021 : 15 / 15th International Scientific-Technical Conference on Actual Problems of Electronic Instrument Engineering, APEIE 2021 (2021 ; 19.11 - 21.11 ; Novosibirsk) : Institute of Electrical and Electronics Engineers Inc., 2021. - P. 499-503. - DOI 10.1109/APEIE52976.2021.9647632.
Год издания: 2021
Авторы: Orlov V.I. , Rozhnov I.P. , Kazakovtsev L.A. , Rezova N.L. , Popov V.P. , Mikhnev D.L.
Издательство: Institute of Electrical and Electronics Engineers Inc.
Источник: Proceedings of the 2021 15th International Scientific-Technical Conference on Actual Problems of Electronic Instrument Engineering, APEIE 2021
Номера страниц: 499-503
Держатель оригинала документа: Jsc 'Testing Technical Center-NPO PM', Reshetnev Siberian State University of Science and Technology
Мероприятие: 15th International Scientific-Technical Conference on Actual Problems of Electronic Instrument Engineering, APEIE 2021 (Novosibirsk, 2021 ; 19.11 - 21.11)
Количество экземпляров:
Твёрдая копия издания отсутствует в фонде библиотеки

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